Atomic Force Microscopy, Surface Probe Microscopy, Intermodulation AFM.
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AFM Bruker Dimension ICON
Lateral scan range 90 x 90 µm, vertical 10 µm, sample size max. 210 mm, max thickness 15 mm, Nanoscope V controller.
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AFM Bruker Dimension FastScan
Lateral scan range 34 x 34 µm, vertical 3 µm, sample size max. 210 mm, max thickness 15 mm, Nanoscope V controller. Scan speed up to 90 Hz, 300×300 pixels, with FastScan cantilever.
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AFM JPK Nanowizard 3 Bioscience
AFM combined w. optical inverted microscope, fluorescence imaging, cooled CCD camera
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AFM JPK Nanowizard 3 Ultraspeed
Atomic resolution and scan rate of 10 fps