Various techniques for physical characterization of materials and devices.
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DynaCool PPMS by Quantum Design
Physical Properties Measurement System: base T=2–400 K, electrical measurements (resistance, AC-resistance, I-V characteristics), magnetic measurements (VSM, AC-susceptibility), thermal measurements (heat capacity), RF-insert, higher pressure.
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PPMS EverCool II, Quantum Design
Magnetic, electrical, thermal, mechanical, optical measurements at low temperatures. Closed helium cycle. Material characterization at 1.9 – 400 K, 9 T magnet; options for magnetic moment, susceptibility, resistivity, Hall coefficient, thermal capacity, thermal expansion and more.
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VASE Ellipsometer by Wollam
VASE Ellipsometer-Spectrometer measures the optical constants and thickness of films, multilayers or bulk materials, as well as the reflection/transmission as a function of angle of incidence (12° to 90°), polarization, and wavelength in the UV-IR range: 240 nm – 2500 nm, 4 um option available. Beam focusing option available for testing small structures.
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AFM Bruker Dimension ICON
Lateral scan range 90 x 90 µm, vertical 10 µm, sample size max. 210 mm, max thickness 15 mm, Nanoscope V controller.
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AFM Bruker Dimension FastScan
Lateral scan range 34 x 34 µm, vertical 3 µm, sample size max. 210 mm, max thickness 15 mm, Nanoscope V controller. Scan speed up to 90 Hz, 300×300 pixels, with FastScan cantilever.
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AFM JPK Nanowizard 3 Bioscience
AFM combined w. optical inverted microscope, fluorescence imaging, cooled CCD camera
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AFM JPK Nanowizard 3 Ultraspeed
Atomic resolution and scan rate of 10 fps